Invention Grant
- Patent Title: Scintillation measuring method of display device and scintillation measuring device
- Patent Title (中): 显示装置和闪烁测量装置的闪烁测量方法
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Application No.: US11516185Application Date: 2006-09-06
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Publication No.: US07643061B2Publication Date: 2010-01-05
- Inventor: Eiichi Yamagishi
- Applicant: Eiichi Yamagishi
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2005-259593 20050907
- Main IPC: H04N5/225
- IPC: H04N5/225 ; H04N7/00 ; H04N7/18 ; G06K9/00 ; G06F3/038

Abstract:
A measuring method of scintillation appearing on a display image of a display device installed with a light source including: capturing the display image from a plurality of capturing positions respectively having different capturing angles relative to the display image to obtain a plurality of captured images; and acquiring scintillation by comparing pixels of the captured images each corresponding to a common pixel of the display image and acquiring data of pixels having different luminance as scintillation information.
Public/Granted literature
- US20070052800A1 Scintillation measuring method of display device and scintillation measuring device Public/Granted day:2007-03-08
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