Invention Grant
- Patent Title: Electromagnetic wave analysis apparatus and design support apparatus
- Patent Title (中): 电磁波分析装置及设计支持装置
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Application No.: US11311992Application Date: 2005-12-20
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Publication No.: US07642973B2Publication Date: 2010-01-05
- Inventor: Tomoya Maekawa , Tetsuyoshi Ogura , Toru Yamada
- Applicant: Tomoya Maekawa , Tetsuyoshi Ogura , Toru Yamada
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: JP2004-371994 20041222; JP2005-103800 20050331
- Main IPC: G01R29/10
- IPC: G01R29/10 ; G01R31/302
Abstract:
A design support apparatus of the present invention includes the following: an antenna electromagnetic field distribution input portion that inputs data indicating an antenna electromagnetic field distribution in the vicinity of electronic equipment; a board near electromagnetic field distribution input portion that inputs data indicating a board near electromagnetic field distribution as unwanted radiation noise radiated from a board of the electronic equipment; and a correlation value generator that generates a distribution of correlation values showing a correlation between the antenna electromagnetic field and the board near electromagnetic field based on the antenna electromagnetic field distribution data and the board near electromagnetic field distribution data.
Public/Granted literature
- US20060132118A1 Electromagnetic wave analysis apparatus and design support apparatus Public/Granted day:2006-06-22
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