Method for enabling use of the same, existing test programs for both an obsolete and new waveform digitizer, each having an analog input interface and a digital output interface, entails providing an automatic test equipment for hosting test programs for using a waveform digitizer, and determining scalers and low voltage monolithic analog-to-digital converters to couple to the analog input interface and digital output interface of the new waveform digitizer. As such, the new waveform digitizer provides the same function, or has the same functionality as, as the obsolete waveform digitizer, and the same, existing test programs can be used for the new waveform digitizer as were used for the obsolete waveform digitizer.