Invention Grant
US07642790B2 Systems and methods for testing conductive members employing electromagnetic back scattering
有权
用于测试使用电磁反射散射的导电部件的系统和方法
- Patent Title: Systems and methods for testing conductive members employing electromagnetic back scattering
- Patent Title (中): 用于测试使用电磁反射散射的导电部件的系统和方法
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Application No.: US11729366Application Date: 2007-03-27
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Publication No.: US07642790B2Publication Date: 2010-01-05
- Inventor: Gale D. Burnett , Charles A. Frost
- Applicant: Gale D. Burnett , Charles A. Frost
- Applicant Address: US NY Manhasset
- Assignee: Profile Technologies, Inc.
- Current Assignee: Profile Technologies, Inc.
- Current Assignee Address: US NY Manhasset
- Agency: Schacht Law Office, Inc.
- Agent Michael R. Schacht
- Main IPC: G01R31/11
- IPC: G01R31/11

Abstract:
A system or method of analyzing a conductive member for the presence an anomaly. A conductive pipe member is analyzed for the presence an anomaly the electromagnetic properties of which are non-linear. The electromagnetic properties of the pipe member at the anomaly are altered by applying a direct current perturbation signal to the pipe member. At least one test source signal is applied to a first test location on the pipe member remote from the anomaly to cause the at least one test source signal to travel along the pipe through the anomaly. At least one test return signal associated with the at least one test source signal traveling through the anomaly is detected. The at least one test return signal is analyzed for characteristics associated with the anomaly.
Public/Granted literature
- US20080191706A1 Systems and methods for testing conductive members employing electromagnetic back scattering Public/Granted day:2008-08-14
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