Invention Grant
- Patent Title: Method and apparatus for measuring duty cycle
- Patent Title (中): 测量占空比的方法和装置
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Application No.: US11371316Application Date: 2006-03-07
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Publication No.: US07642767B2Publication Date: 2010-01-05
- Inventor: Andre Willis
- Applicant: Andre Willis
- Applicant Address: US CA Menlo Park
- Assignee: Synthesys Research, Inc
- Current Assignee: Synthesys Research, Inc
- Current Assignee Address: US CA Menlo Park
- Agency: Peninsula IP Group
- Agent Douglas Chaikin
- Main IPC: G01R13/02
- IPC: G01R13/02

Abstract:
Disclosed herein is a method and apparatus used to the measure duty cycle of a clocking waveform utilizing minimal hardware and achieving high accuracy. This invention utilizes digital sampling of the signal to be measured at a rate that can be significantly lower then the clocking frequency of the signal to be measured. It accomplishes broad-band, multi-frequency use by using a time-varying frequency for the sampling clock to make sure that the sampling clock is asynchronous with the frequency of the clocking signal to be measured. The average ratio of the sampled ones (or zeros) as compared to the total number of samples is then computed to derive the measurement of duty cycle.
Public/Granted literature
- US20080013668A1 Method and apparatus for measuring duty cycle Public/Granted day:2008-01-17
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