Invention Grant
- Patent Title: Semiconductor apparatus
- Patent Title (中): 半导体装置
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Application No.: US10459524Application Date: 2003-06-12
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Publication No.: US07642620B2Publication Date: 2010-01-05
- Inventor: Akio Tanaka
- Applicant: Akio Tanaka
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Young & Thompson
- Priority: JP2002-174432 20020614
- Main IPC: H01L27/00
- IPC: H01L27/00

Abstract:
It is an object of the present invention to provide a semiconductor apparatus for solving a trade-off between the area, power consumption, noise and accuracy of correction of a variation correction circuit that corrects variations in resistance and threshold voltage, etc. The present invention comprises a multi-value voltage generation circuit shared by a plurality of reading circuits, a multi-value voltage bus that supplies multi-value voltages to the reading circuits and switches that select a voltage suited to variation correction from multi-value voltages, wherein the multi-value voltages are distributed from the multi-value voltage generation circuit to the plurality of reading circuits, the switches select an optimum voltage for correction in the respective reading circuits to thereby correct variations in the elements.
Public/Granted literature
- US20030230733A1 Semiconductor apparatus Public/Granted day:2003-12-18
Information query
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