Invention Grant
- Patent Title: Air gap in integrated circuit inductor fabrication
- Patent Title (中): 集成电路电感器制造中的气隙
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Application No.: US12489773Application Date: 2009-06-23
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Publication No.: US07642619B2Publication Date: 2010-01-05
- Inventor: Phillip D. Matz , Stephan Grunow , Satyavolu Srinivas Papa Rao
- Applicant: Phillip D. Matz , Stephan Grunow , Satyavolu Srinivas Papa Rao
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Warren L. Franz; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L29/00
- IPC: H01L29/00

Abstract:
A semiconductor device, such as an inductor, is formed with an air gap. A first level has an intra-metal dielectric layer including one or more inductor loops, one or more vias, and one or more copper bulkhead structures. An inter-level dielectric layer is formed over the first level. An extraction via is formed through the intra-metal dielectric layer and inter-level dielectric layer. An air gap is formed between inductor loops by removing portions of the intra-metal dielectric layer coupled to the extraction via using a supercritical fluid process, and forming a non-conformal layer to seal the extraction via. The air gap may be filled with an inert gas, like argon or nitrogen.
Public/Granted literature
- US20090261453A1 AIR GAP IN INTEGRATED CIRCUIT INDUCTOR FABRICATION Public/Granted day:2009-10-22
Information query
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