Invention Grant
- Patent Title: Radiation detecting apparatus and method for manufacturing the same
- Patent Title (中): 辐射检测装置及其制造方法
-
Application No.: US12260035Application Date: 2008-10-28
-
Publication No.: US07642519B2Publication Date: 2010-01-05
- Inventor: Kazumi Nagano
- Applicant: Kazumi Nagano
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2003-102895 20030407
- Main IPC: G01T1/20
- IPC: G01T1/20

Abstract:
An underlayer of a phosphor layer is disposed on a sensor panel including two-dimensionally arranged photoelectric conversion devices. The surface of the underlayer is subjected to atmospheric pressure plasma treatment. The phosphor layer is formed on the surface-treated underlayer. Then, the phosphor layer is covered with a moisture-resistant protective layer, a reflection layer, and another protective layer. Thus, the phosphor layer is prevented from peeling due to adhesion failure, and is constituted of uniformly shaped crystals by vapor deposition. A resulting radiation detecting apparatus exhibits high sensitivity and high definition, producing a uniform photoelectric conversion efficiency.
Public/Granted literature
- US20090061555A1 RADIATION DETECTING APPARATUS AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2009-03-05
Information query