Invention Grant
US07642200B2 Methods of forming a thin film and methods of manufacturing a capacitor and a gate structure using the same
有权
薄膜的形成方法以及使用该薄膜的制造电容器和栅极结构的方法
- Patent Title: Methods of forming a thin film and methods of manufacturing a capacitor and a gate structure using the same
- Patent Title (中): 薄膜的形成方法以及使用该薄膜的制造电容器和栅极结构的方法
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Application No.: US11331744Application Date: 2006-01-13
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Publication No.: US07642200B2Publication Date: 2010-01-05
- Inventor: Jung-Ho Lee , Jun-Hyun Cho , Jung-Sik Choi , Sang-Mun Chon
- Applicant: Jung-Ho Lee , Jun-Hyun Cho , Jung-Sik Choi , Sang-Mun Chon
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2005-0006173 20050124
- Main IPC: H01L21/31
- IPC: H01L21/31 ; H01L21/336

Abstract:
A method of forming a thin film is provided. The method includes introducing an organometallic compound represented by the following formula onto a substrate; wherein M represents a metal in listed in Group 4A of the periodic table of elements, R1, R2 and R3 independently represent hydrogen or an alkyl group having a carbon number from 1 to 5, and X represents hydrogen or an alkyl group having a carbon number from 1 to 5 and then chemisorbing a portion of the organometallic compound on the substrate. The method further includes removing a non-chemisorbed portion of the organometallic compound from the substrate, providing an oxidizing agent onto the substrate and forming a thin film including a metal oxide on the substrate by chemically reacting the oxidizing agent with a metal in the organometallic compound and by separating ligands of the organometallic compound.
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