Invention Grant
- Patent Title: Semiconductor substrate and manufacturing method for the same
- Patent Title (中): 半导体衬底及其制造方法相同
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Application No.: US11199597Application Date: 2005-08-08
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Publication No.: US07642179B2Publication Date: 2010-01-05
- Inventor: Hajime Ikeda , Kazuya Notsu , Nobuhiko Sato , Shoji Nishida
- Applicant: Hajime Ikeda , Kazuya Notsu , Nobuhiko Sato , Shoji Nishida
- Applicant Address: JP Tokyo
- Assignee: Canon Kabuhsiki Kaisha
- Current Assignee: Canon Kabuhsiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc., IP Division
- Priority: JP2004-234353 20040811; JP2005-123984 20050421
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A method of manufacturing a semiconductor substrate includes a growing step of growing a second single crystalline semiconductor on a first single crystalline semiconductor, a blocking layer forming step of forming a blocking layer on the second single crystalline semiconductor, and a relaxing step of generating crystal defects at a portion deeper than the blocking layer to relax a stress acting on the second single crystalline semiconductor. The blocking layer includes, e.g., a porous layer, and prevents the crystal defects at the portion deeper than the blocking layer from propagating to the surface of the second single crystalline semiconductor.
Public/Granted literature
- US20060035447A1 Semiconductor substrate and manufacturing method for the same Public/Granted day:2006-02-16
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