Invention Grant
- Patent Title: Method and probes for the detection of chromosome aberrations
- Patent Title (中): 用于检测染色体畸变的方法和探针
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Application No.: US12071268Application Date: 2008-02-19
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Publication No.: US07642057B2Publication Date: 2010-01-05
- Inventor: Jacobus Johannus Maria Van Dongen , Karl-Johan Pluzek , Kristen Vang Nielsen , Kim Adelhorst
- Applicant: Jacobus Johannus Maria Van Dongen , Karl-Johan Pluzek , Kristen Vang Nielsen , Kim Adelhorst
- Applicant Address: DK Glostrup
- Assignee: Dako Denmark A/S
- Current Assignee: Dako Denmark A/S
- Current Assignee Address: DK Glostrup
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Priority: DK199800615 19980504
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C07H21/00 ; C07H21/02 ; C07H21/04

Abstract:
A novel method for detecting chromosome aberrations is disclosed. More specifically, chromosome aberrations are detected by in situ hybridisation using at least two sets of hybridisation probes, at least one set comprising one or more peptide nucleic acid probes capable of hybridising to specific nucleic acid sequences related to a potential aberration in a chromosome, and at least one set comprising two or more peptide nucleic acid probes capable of hybridising to specific nucleic acid sequences related to another potential aberration in a chromosome. In particular, the method may be used for detecting chromosome aberrations in the form of breakpoints.
Public/Granted literature
- US20080187934A1 Method and probes for the detection of chromosome aberrations Public/Granted day:2008-08-07
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