Invention Publication
- Patent Title: RANDOM ACCESS-TYPE MEMORY CIRCUIT AND MEMORY SYSTEM
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Application No.: US17801864Application Date: 2021-02-18
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Publication No.: US20230170005A1Publication Date: 2023-06-01
- Inventor: Toru TANZAWA
- Applicant: NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
- Applicant Address: JP Shizuoka-shi, Shizuoka
- Assignee: NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
- Current Assignee: NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
- Current Assignee Address: JP Shizuoka-shi, Shizuoka
- Priority: JP 20033160 2020.02.28
- International Application: PCT/JP2021/006183 2021.02.18
- Date entered country: 2022-08-24
- Main IPC: G11C7/22
- IPC: G11C7/22 ; G11C7/02 ; G11C7/24

Abstract:
A memory circuit includes: a memory array unit including a plurality of memory cells and a word line for connecting the plurality of memory cells to each other and applying a drive voltage for driving the memory cells; a drive voltage control unit that generates a drive voltage in which a pre-pulse is set at a timing corresponding to the rising or falling of a voltage signal that changes by a predetermined voltage value in a stepwise manner, applies the drive voltage to a terminal of the word line, and performs control to variably set the time width or the peak value of the pre-pulse in the drive voltage based on address information designating the memory cell at an access destination received from the outside; and a sense amplifier unit that accesses the memory cell designated by the address information.
Public/Granted literature
- US11978529B2 Random access-type memory circuit and memory system Public/Granted day:2024-05-07
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