Invention Grant
- Patent Title: Singulation and bonding methods and structures formed thereby
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Application No.: US17833100Application Date: 2022-06-06
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Publication No.: US12159860B2Publication Date: 2024-12-03
- Inventor: Chen-Hua Yu , Tsang-Jiuh Wu , Wen-Chih Chiou
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L23/538
- IPC: H01L23/538 ; H01L21/56 ; H01L21/78 ; H01L23/31 ; H01L25/00 ; H01L25/065 ; H01L21/768

Abstract:
Methods of singulation and bonding, as well as structures formed thereby, are disclosed. A method includes singulating a first chip and after the singulating the first chip, bonding the first chip to a second chip. The first chip includes a first semiconductor substrate and a first interconnect structure on a front side of the first semiconductor substrate. The singulating the first chip includes etching through a back side of the first semiconductor substrate through the first interconnect structure.
Public/Granted literature
- US20220310565A1 Singulation and Bonding Methods and Structures Formed Thereby Public/Granted day:2022-09-29
Information query
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