Invention Grant
- Patent Title: System and method for monitoring manufacturing
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Application No.: US17321140Application Date: 2021-05-14
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Publication No.: US12158751B2Publication Date: 2024-12-03
- Inventor: Nathan Oostendorp , Kurtis Alan Demaagd , Ryan Smith
- Applicant: Sight Machine, Inc.
- Applicant Address: US CA San Francisco
- Assignee: Sight Machine, Inc.
- Current Assignee: Sight Machine, Inc.
- Current Assignee Address: US CA San Francisco
- Agency: DLA Piper LLP (US)
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G05B19/418 ; G06F16/951 ; G06Q10/0639 ; G06Q50/04 ; G08B21/18

Abstract:
A system for monitoring manufacturing includes one or more sensors and a controller in communication with the one or more sensors. The controller may include one or more processors that determine a quality metric represented by machine data collected from one or more machine data sensors and identify a correlation value between the machine data and environmental data collected from one or more environmental data sensors. The controller may further include determine if the correlation value exceeds a predetermined threshold value, and if the correlation value exceeds the predetermined threshold value, report at least one of the correlation value and the quality metric.
Public/Granted literature
- US20210349455A1 SYSTEM AND METHOD FOR MONITORING MANUFACTURING Public/Granted day:2021-11-11
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