Invention Grant
- Patent Title: Automatic display pixel inspection system and method
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Application No.: US17597433Application Date: 2019-07-09
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Publication No.: US12112469B2Publication Date: 2024-10-08
- Inventor: Seunghwan Seok , Hyohyung Lee , Inbum Yang , Bongwoon Choi
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: LEE, HONG, DEGERMAN, KANG & WAIMEY
- Priority: KR 20190082790 2019.07.09
- International Application: PCT/KR2019/008450 2019.07.09
- International Announcement: WO2021/006379A 2021.01.14
- Date entered country: 2022-01-05
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01N21/95 ; H01L27/15 ; H01L33/00 ; H01L33/44
Abstract:
The present invention relates to an automatic display pixel inspection system and method and, particularly, to an automatic inspection system and method for inspecting defects occurring in the process of assembling semiconductor light emitting devices in a fluid.
Public/Granted literature
- US20220284559A1 AUTOMATIC DISPLAY PIXEL INSPECTION SYSTEM AND METHOD Public/Granted day:2022-09-08
Information query
