Invention Grant
- Patent Title: Method and apparatus for detecting dimension error
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Application No.: US17163051Application Date: 2021-01-29
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Publication No.: US12112468B2Publication Date: 2024-10-08
- Inventor: Hye-Jin Kim , Suyoung Chi
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: William Park & Associates Ltd.
- Priority: KR 20200010952 2020.01.30 KR 20200135260 2020.10.19 KR 20210009059 2021.01.22
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06N20/00 ; G06T7/00 ; G06T7/50

Abstract:
An apparatus for detecting a dimension error obtains an image of a target object, estimates dimensional data for a region of interest (ROI) for which dimensions are to be measured from the image of the target object using a learned dimensional measurement model, and determines whether there is a dimension error in the ROI from the estimated dimension data using a learned dimension error determination model.
Public/Granted literature
- US20210241450A1 METHOD AND APPARATUS FOR DETECTING DIMENSION ERROR Public/Granted day:2021-08-05
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