Invention Grant
- Patent Title: Semiconductor device structure and methods of forming the same
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Application No.: US17742452Application Date: 2022-05-12
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Publication No.: US12080751B2Publication Date: 2024-09-03
- Inventor: Hsueh-Han Lu , Kun-Ei Chen , Chen-Chieh Chiang , Ling-Sung Wang , Jun-Nan Nian
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: NZ CARR LAW OFFICE
- Main IPC: H01L49/02
- IPC: H01L49/02 ; H01L21/3115 ; H01L21/768 ; H01L21/822 ; H01L27/06 ; H01L21/8234

Abstract:
Semiconductor device structure and methods of forming the same are described. The structure includes a first dielectric layer including a first portion disposed over a source/drain region in an active region of a substrate and a modulation portion over an interlayer dielectric (ILD) in a resistor region of the substrate, the first portion of the first dielectric layer has a first composition, and the modulation portion of the first dielectric layer has a second composition different from the first composition. The structure further includes a resistor layer disposed on the modulation portion of the first dielectric layer in the resistor region and a second dielectric layer disposed over the first dielectric layer in the active region and over the resistor layer in the resistor region.
Public/Granted literature
- US20230369386A1 SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME Public/Granted day:2023-11-16
Information query
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