Invention Grant
- Patent Title: Calibration circuit and semiconductor device including the same
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Application No.: US17903578Application Date: 2022-09-06
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Publication No.: US12033717B2Publication Date: 2024-07-09
- Inventor: Jaehyeok Baek , Daehyun Kwon , Hyejung Kwon , Donggun An , Daewoong Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR 20210178532 2021.12.14 KR 20220029491 2022.03.08
- Main IPC: G11C7/10
- IPC: G11C7/10

Abstract:
A calibration circuit includes a first, second and third pull-up units each connected to a first power supply node, and first and second pull-down units each connected to a second power supply node. A first code generator is configured to generate a first code by comparing a voltage of a pad at which the first pull-up unit is connected to an external resistor with a reference voltage, and a second code generator is configured to generate a second code by comparing a voltage of a first intermediate node with the reference voltage and output the second code to the first and second pull-down units. A third code generator is configured to generate a third code by comparing a voltage of a second intermediate node between the second pull-down unit and the third pull-up unit with the reference voltage.
Public/Granted literature
- US20230186958A1 CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME Public/Granted day:2023-06-15
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