Invention Grant
- Patent Title: TOF mass calibration
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Application No.: US17310989Application Date: 2020-06-10
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Publication No.: US11948788B2Publication Date: 2024-04-02
- Inventor: Robert E. Haufler , William M. Loyd , Takashi Baba
- Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Kasha Law LLC
- Agent John R. Kasha; Kelly L. Kasha
- International Application: PCT/IB2020/055464 2020.06.10
- International Announcement: WO2020/250157A 2020.12.17
- Date entered country: 2021-09-03
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/00

Abstract:
A calibration apparatus for a mass analyzer includes an ion source device and a dual-purpose electron beam generating unit. The ion source device ionizes an analyte of a sample, producing analyte ions. The dual-purpose electron beam generating unit is positioned between the ion source device and the mass analyzer. In a first mode, the dual-purpose electron beam generating unit is used to create fragments of analyte ions of unknown mass-to-charge ratio. In a second mode, the dual-purpose electron beam generating unit is used to create ions of calibration compounds of known mass-to-charge ratio. All ions are subsequently transferred to the mass analyzer.
Public/Granted literature
- US20220093383A1 TOF Mass Calibration Public/Granted day:2022-03-24
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