Invention Grant
- Patent Title: Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method
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Application No.: US17106986Application Date: 2020-11-30
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Publication No.: US11948321B2Publication Date: 2024-04-02
- Inventor: Kaoru Miyata
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki
- Agency: Rankin, Hill & Clark LLP
- Priority: JP 19222105 2019.12.09 JP 20187857 2020.11.11
- Main IPC: G06T7/60
- IPC: G06T7/60 ; G01B11/25 ; G06T7/521 ; G06T7/73

Abstract:
A three-dimensional geometry measurement apparatus including: a preliminary measurement part that creates a plurality of pieces of preliminary measurement data indicating three-dimensional coordinates of a reference point on a reference instrument; a reference data creation part that creates reference data; a calculation part that calculates a correction value on the basis of the reference data and the preliminary measurement data which does not match the reference data; a target measuring part that creates target measurement data indicating results of measuring a measurement point of the object to be measured; a correction part that corrects the target measurement data in the measurement system corresponding to the preliminary measurement data that does not match the reference data, on the basis of the correction value; and a geometry identification part that identifies a geometry of the object to be measured using the corrected target measurement data.
Public/Granted literature
- US20210174531A1 THREE-DIMENSIONAL GEOMETRY MEASUREMENT APPARATUS AND THREE-DIMENSIONAL GEOMETRY MEASUREMENT METHOD Public/Granted day:2021-06-10
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