The present application provides a method for testing a memory, including the steps of: providing a database, the database including a deviation value between a data strobe signal and a clock signal and a corresponding relationship between the deviation value and a memory parameter; searching the database for a deviation value corresponding to a preset memory parameter when a read command is applied to the memory under the preset memory parameter; acquiring a time value at which an output signal is to be captured according to the deviation value; and capturing the output signal at the time value to perform the testing for the memory.