- Patent Title: Apparatus for estimating contact distribution and method thereof
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Application No.: US17553638Application Date: 2021-12-16
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Publication No.: US11928858B2Publication Date: 2024-03-12
- Inventor: Yong Hoon Jang , Ilkwang Jang
- Applicant: UIF (University Industry Foundation), Yonsei University
- Applicant Address: KR Seoul
- Assignee: UIF (University Industry Foundation), Yonsei University
- Current Assignee: UIF (University Industry Foundation), Yonsei University
- Current Assignee Address: KR Seoul
- Agency: Park, Kim & Suh, LLC
- Priority: KR 20200176384 2020.12.16
- Main IPC: G06V10/82
- IPC: G06V10/82 ; G06N3/02 ; G06T9/00 ; G06V10/32 ; G06V10/778 ; G06V10/98

Abstract:
An apparatus for estimating contact distribution to quickly estimate contact spot distribution from a contact surface image using a deep learning model based on a convolution neural network (CNN) and a method thereof are disclosed. A method for estimating contact distribution to estimate contact spot distribution between a first contact spot and a second contact spot includes inputting a contact surface image of at least one of the first contact surface and the second contact surface to a deep learning model based on a CNN and estimating contact spot distribution between the first contact surface and the second contact surface from an output of the deep learning model.
Public/Granted literature
- US20220189153A1 APPARATUS FOR ESTIMATING CONTACT DISTRIBUTION AND METHOD THEREOF Public/Granted day:2022-06-16
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