Invention Grant
- Patent Title: Distributed control system, automatic analysis device, and automatic analysis system
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Application No.: US17260039Application Date: 2019-05-27
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Publication No.: US11863374B2Publication Date: 2024-01-02
- Inventor: Takafumi Hasegawa
- Applicant: HITACHI HIGH-TECH CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe Koenig
- Priority: JP 18140550 2018.07.26
- International Application: PCT/JP2019/020808 2019.05.27
- International Announcement: WO2020/021839A 2020.01.30
- Date entered country: 2021-01-13
- Main IPC: H04L41/0686
- IPC: H04L41/0686 ; H04L43/0811 ; G01N35/00 ; G16H10/40 ; G06F11/30 ; G06F11/32 ; G01R31/317

Abstract:
In a distributed control system, when the determination that an error has occurred is made as a result of comparison of correct connection information retained in a storage unit and connection information of an actually connected control object device or terminal communication device by a comparison unit, a central computation device outputs a display signal of an abnormal part to a display device, and the display device displays the abnormal part on the basis of the display signal. A distributed control system and an automatic analysis device provided with the same, and an automatic analysis system are thereby provided, whereby an erroneous connections or defects can be more easily and reliably detected than in the prior art, even when a plurality of control boards are distributedly arranged in the same device.
Public/Granted literature
- US20220006691A1 DISTRIBUTED CONTROL SYSTEM, AUTOMATIC ANALYSIS DEVICE, AND AUTOMATIC ANALYSIS SYSTEM Public/Granted day:2022-01-06
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