- Patent Title: Semiconductor memory device for reducing effect of leakage current
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Application No.: US17643499Application Date: 2021-12-09
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Publication No.: US11862293B2Publication Date: 2024-01-02
- Inventor: Noriyasu Kumazaki
- Applicant: KIOXIA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: KIOXIA CORPORATION
- Current Assignee: KIOXIA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP 21102806 2021.06.21
- Main IPC: G11C8/14
- IPC: G11C8/14 ; G11C8/08

Abstract:
A semiconductor memory device includes memory cell arrays including a first memory cell and a first word line connected to the first memory cell, a first wiring electrically connected to the first word lines corresponding to the memory cell arrays, a driver circuit electrically connected to the first wiring, second wirings electrically connected to the first wiring via the driver circuit, a voltage generation circuit including output terminals disposed corresponding to the second wirings, and first circuits disposed corresponding to the memory cell arrays. The voltage generation circuit is electrically connected to the first word lines via a first current path including the second wirings, the driver circuit, and the first wiring. The voltage generation circuit is electrically connected to the first word lines via a second current path including the second wirings and the first circuits and without including the driver circuit.
Public/Granted literature
- US20220406351A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2022-12-22
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