Invention Grant
- Patent Title: Systems and methods for pre-read scan of memory devices
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Application No.: US17463152Application Date: 2021-08-31
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Publication No.: US11862226B2Publication Date: 2024-01-02
- Inventor: Karthik Sarpatwari , Fabio Pellizzer , Nevil N. Gajera , Yen Chun Lee , Ferdinando Bedeschi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: G11C11/4074
- IPC: G11C11/4074 ; G11C7/10 ; G11C11/4096

Abstract:
Methods and systems include memory devices with a memory array comprising a plurality of memory cells. The memory devices include a control circuit operatively coupled to the memory array and configured to receive a read request for data and to apply a plurality of read voltages to the memory array based on the read request. The control circuit is further configured to perform a data analysis for a first set of data read based on the application of the plurality of read voltages and to derive a demarcation bias voltage (VDM) based on the data analysis. The control circuit is also configured to apply the VDM to the memory array to read a second set of data.
Public/Granted literature
- US20230067396A1 SYSTEMS AND METHODS FOR PRE-READ SCAN OF MEMORY DEVICES Public/Granted day:2023-03-02
Information query
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