Invention Grant
- Patent Title: Memory cell and method of operating the same
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Application No.: US18156593Application Date: 2023-01-19
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Publication No.: US11862219B2Publication Date: 2024-01-02
- Inventor: Bo-Feng Young , Sai-Hooi Yeong , Chao-I Wu , Chih-Yu Chang , Yu-Ming Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: HAUPTMAN, HAM, LLP
- Main IPC: G11C11/22
- IPC: G11C11/22 ; H10B51/30

Abstract:
A memory cell includes a write bit line, a read word line, a write transistor, and a read transistor. The write transistor is coupled between the write bit line and a first node. The read transistor is coupled to the write transistor by the first node. The read transistor includes a ferroelectric layer, a drain terminal of the read transistor is coupled to the read word line, and a source terminal of the read transistor is coupled to a second node. The write transistor is configured to set a stored data value of the memory cell by a write bit line signal that adjusts a polarization state of the read transistor. The polarization state corresponds to the stored data value.
Public/Granted literature
- US20230162774A1 MEMORY CELL AND METHOD OF OPERATING THE SAME Public/Granted day:2023-05-25
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