Invention Grant
- Patent Title: Automatic analysis apparatus
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Application No.: US18075707Application Date: 2022-12-06
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Publication No.: US11860179B2Publication Date: 2024-01-02
- Inventor: Ayaka Hashimoto , Kazunori Yamazawa , Takenorì Okusa
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP 18012056 2018.01.26
- The original application number of the division: US16649500
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/00

Abstract:
To provide a high-throughput automatic analysis apparatus at a lower cost. The automatic analysis apparatus includes an incubator which accommodates a plurality of reaction vessels; a specimen dispensing mechanism which dispenses a specimen into each of the plurality of reaction vessels; a mounting unit which mounts a dispensing tip on the specimen dispensing mechanism; a suction unit which sucks a specimen from a specimen vessel containing the specimen by means of the specimen dispensing mechanism having the dispensing mounted thereon; a discharging unit which is provided in the incubator and discharges the specimen from the specimen dispensing mechanism to the reaction vessel; a disposal unit which discards the dispensing tip; a sensor which detects whether the dispensing tip is mounted to the specimen dispensing mechanism; and a control unit which controls the specimen dispensing mechanism. The mounting unit, the suction unit, the discharging unit, and the disposal unit are arranged along a movement path of the specimen dispensing mechanism. The sensor is arranged so as to be able to detect the dispensing tip at a position sandwiched between any two of the mounting unit, the suction unit, the discharging unit, and the disposal unit.
Public/Granted literature
- US20230095937A1 Automatic Analysis Apparatus Public/Granted day:2023-03-30
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