Invention Grant
- Patent Title: Inspection system and inspection method
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Application No.: US17692359Application Date: 2022-03-11
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Publication No.: US11860112B2Publication Date: 2024-01-02
- Inventor: Naoya Nakayama , Masanori Sekido , Shinichi Morimoto , Masayuki Ariyoshi , Tatsuya Sumiya , Toshiyuki Nomura , Toshinori Takemura
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP 21045901 2021.03.19
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/10 ; G01N23/18 ; G01V5/00

Abstract:
To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unit 12 that performs detection processing of detecting an abnormal state, based on a signal of the reflection wave; a decision unit 13 that decides, for an inspection target person from which the abnormal state is detected, whether to perform a secondary inspection at a place or perform a secondary inspection later; and a registration unit 16 that registers, in association with a result of the detection processing, identification information about the inspection target person decided that a secondary inspection is performed later.
Public/Granted literature
- US20220299454A1 INSPECTION SYSTEM AND INSPECTION METHOD Public/Granted day:2022-09-22
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