Invention Grant
- Patent Title: Apparatus and method for in-situ optical inspection of laser-induced surface modifications and laser process control
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Application No.: US17189221Application Date: 2021-03-01
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Publication No.: US11860091B2Publication Date: 2024-01-02
- Inventor: Iraj Kavosh , Raya Kavosh
- Applicant: Iraj Kavosh , Raya Kavosh
- Applicant Address: US CA San Jose
- Assignee: Iraj Kavosh,Raya Kavosh
- Current Assignee: Iraj Kavosh,Raya Kavosh
- Current Assignee Address: US CA San Jose
- Agent Edmond DeFrank
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/47 ; G01N21/88 ; G01N21/65 ; G01J3/26

Abstract:
The embodiments disclose a method for in-situ inspection and processing of an object including providing a pulsed laser source during the in-situ inspection of a surface of the object for modifying at least one of an optical, mechanical, or chemical property of a first region of the surface, directing the laser source through an optics path to shape, position and focus a pulsed laser beam at the first region, directing a probe illumination light beam to the optics path to produce a combined and collinear optical light path of the probe illumination light beam and the pulsed laser beam to focus and deliver the combined and collinear optical light path at a same region on the surface, superimposing a first focus spot of the probe illumination light beam over a second focus spot of the pulsed laser beam on an illuminated region of the surface.
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