Invention Grant
- Patent Title: Apparatus and method of testing an object within a dry gas environment
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Application No.: US17370090Application Date: 2021-07-08
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Publication No.: US11860083B2Publication Date: 2024-01-02
- Inventor: Dahm Yu , Jaehyun Kim , Seonmi Lee , Hyunmin Kwon , Sangjun Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO, LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO, LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR 20200169442 2020.12.07
- Main IPC: G01N19/10
- IPC: G01N19/10 ; G01R31/28

Abstract:
An apparatus for testing an object may include a test chamber, a first chamber, a second chamber, and a gas supply module. The test chamber receives a test board for testing an object. The first chamber is under the test chamber and receives a lower surface of the test board. The second chamber surrounds the first chamber to isolate the first chamber from ambient air. The gas supply module supplies a dry gas to the second chamber to provide a positive pressure higher than an ambient pressure, thereby preventing the ambient air from infiltrating into the first chamber. Thus, during the testing of the object at a low temperature, the second chamber may prevent the humid ambient air from infiltrating into the first chamber to prevent condensation of water on the lower surface of the test board.
Public/Granted literature
- US20220178815A1 APPARATUS AND METHOD OF TESTING AN OBJECT WITHIN A DRY GAS ENVIRONMENT Public/Granted day:2022-06-09
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