Invention Grant
- Patent Title: Event analysis system and event analysis method
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Application No.: US17200135Application Date: 2021-03-12
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Publication No.: US11721092B2Publication Date: 2023-08-08
- Inventor: Kenichi Morita , Yoshiki Ito
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Volpe Koenig
- Priority: JP 20075448 2020.04.21
- Main IPC: G06V10/82
- IPC: G06V10/82 ; G06V20/40 ; G06V20/64 ; G06F18/2113 ; G06V10/764 ; G06V20/52 ; G06V40/10

Abstract:
An event analysis system capable of appropriately estimating a specific event is provided. Provided are an estimation unit that estimates a track of a person based on video data acquired by a camera, a determination unit that determines, based on determination information for determining a specific event, whether or not the track estimated by the estimation unit corresponds to the specific event, a filter unit that removes, based on normal event information for identifying a normal event, the normal event from the events that have been determined by the determination unit to correspond to the specific event, and an output unit that outputs information indicating that the event is occurring after the normal event has been removed by the filter unit.
Public/Granted literature
- US20210326596A1 EVENT ANALYSIS SYSTEM AND EVENT ANALYSIS METHOD Public/Granted day:2021-10-21
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