Invention Grant
- Patent Title: Semiconductor structure and manufacturing method thereof
-
Application No.: US17004231Application Date: 2020-08-27
-
Publication No.: US11646345B2Publication Date: 2023-05-09
- Inventor: Kai Cheng
- Applicant: ENKRIS SEMICONDUCTOR, INC.
- Applicant Address: CN Suzhou
- Assignee: ENKRIS SEMICONDUCTOR, INC.
- Current Assignee: ENKRIS SEMICONDUCTOR, INC.
- Current Assignee Address: CN Suzhou
- Agency: Westbridge IP LLC
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/778 ; H01L29/267

Abstract:
A semiconductor structure and a manufacturing method thereof is provided. The semiconductor structure includes a high-resistance silicon substrate and a compound layer located on the high-resistance silicon substrate, by performing a way such as local n-type ion implantation, local n-type ion diffusion, selective region epitaxy growth and the like to the high-resistance silicon substrate, an upper part of the high-resistance silicon substrate is formed into a plurality of local n-type semiconductor regions, p-type semiconductor conductive regions formed in the upper part of the high-resistance silicon substrate due to a diffusion of Al, Ga atoms in the compound layer are eliminated, thereby parasitic capacitance caused by a conductive substrate is greatly reduced, and a resistivity of the high-resistance silicon substrate may be improved under high temperature conditions, and then efficiencies and radio frequency characteristics of a microwave device constituted by the entire semiconductor structure are improved.
Information query
IPC分类: