Invention Grant
- Patent Title: Apparatuses, systems, and methods for error correction
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Application No.: US17500666Application Date: 2021-10-13
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Publication No.: US11645150B2Publication Date: 2023-05-09
- Inventor: Toru Ishikawa , Minari Arai
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G06F11/10 ; G06N3/08 ; G06N3/10 ; G06N3/04 ; G11C11/408 ; G11C11/4096

Abstract:
Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. One or more error correction code (ECC) may be used to determine if the bits of information contain any errors. To mitigate the effects of failures of adjacent memory cells, the information may be divided into a first group and a second group, where each group contains information from memory cells which are non-adjacent to other memory cells of that group. Each group of information may include data bits and parity bits used to correct those data bits. For example, as part of a read operation, a first ECC circuit may receive information from even numbered memory cells, while a second ECC circuit may receive information from odd numbered memory cells.
Public/Granted literature
- US20220066875A1 APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION Public/Granted day:2022-03-03
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