Invention Grant
- Patent Title: Measuring device for determining a distance in a conducting structure
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Application No.: US17590899Application Date: 2022-02-02
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Publication No.: US11644558B2Publication Date: 2023-05-09
- Inventor: Andre Giere , Sebastian Lüttich
- Applicant: Astyx MPS GmbH
- Applicant Address: DE Ottobrunn
- Assignee: Astyx MPS GmbH
- Current Assignee: Astyx MPS GmbH
- Current Assignee Address: DE Ottobrunn
- Agency: Fish & Richardson P.C.
- Priority: DE 2013018808.3 2013.11.11
- The original application number of the division: US16594448 2019.10.07
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01R27/08 ; G01R27/26 ; G01B7/02 ; G01B7/14 ; G01S13/38 ; F15B15/28 ; G01S13/88

Abstract:
The invention relates to a distance-measuring device for determining a distance between a reflection body in a conducting structure and a coupling region for electromagnetic waves, which region is provided on an end section of the conducting structure, said measuring device comprising a transmitting and receiving device, and a conduction junction (1) provided on the coupling region, for coupling the transmitting and receiving device to the conducting structure containing a medium, in order to couple an electromagnetic wave into the conducting structure, and to decouple the electromagnetic wave, reflected on the reflection body, from the conducting structure. Said measuring device also comprises an evaluation device for determining the distance between the coupling region and the reflection body from the complex reflection coefficient between the coupled electromagnetic wave and the decoupled electromagnetic wave. The invention also relates to the corresponding method.
Public/Granted literature
- US20220155431A1 MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE Public/Granted day:2022-05-19
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