Invention Grant
- Patent Title: Polarization dependent loss measurement
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Application No.: US17314228Application Date: 2021-05-07
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Publication No.: US11644381B2Publication Date: 2023-05-09
- Inventor: Normand Cyr , Bernard Ruchet
- Applicant: EXFO Optics, SAS
- Applicant Address: FR Lannion
- Assignee: EXFO Optics, SAS
- Current Assignee: EXFO Optics, SAS
- Current Assignee Address: FR Lannion
- Agency: Baratta Law PLLC
- Agent Lawrence A. Baratta, Jr.
- Main IPC: G01M11/00
- IPC: G01M11/00

Abstract:
There is provided a method for measuring the PDL of a DUT as a function of the optical frequency ν within a spectral range, which uses a single wavelength scan over which the input-SOP varies in a continuous manner. The power transmission through the DUT, curve T(ν), is measured during the scan and the PDL is derived from the sideband components of the power transmission curve T(ν) that results from the continuously varying input-SOP. More specifically, the Discrete Fourier Transform (DFT) of the power transmission curve T(ν) is calculated, wherein the DFT shows at least two sidebands. At least two sidebands are extracted and their inverse DFT calculated individually to obtain complex transmissions (ν), =−J . . . J, where J is the number of sidebands on one side. The response vector |m(ν) of the DUT is derived from the complex transmissions (ν) and a matrix determined by the continuous trajectory of the SOP of the input test lightwave; and the PDL of the DUT as a function of ν (PDL curve) is derived therefrom.
Public/Granted literature
- US20210356359A1 POLARIZATION DEPENDENT LOSS MEASUREMENT Public/Granted day:2021-11-18
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