Invention Grant
- Patent Title: Device-state quality analysis
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Application No.: US17106449Application Date: 2020-11-30
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Publication No.: US11621866B1Publication Date: 2023-04-04
- Inventor: Saranya Ramesh , Kalyan C. Nistala
- Applicant: Amazon Technologies, Inc.
- Applicant Address: US WA Seattle
- Assignee: Amazon Technologies, Inc.
- Current Assignee: Amazon Technologies, Inc.
- Current Assignee Address: US WA Seattle
- Agency: Lee & Hayes, P.C.
- Main IPC: H04L12/28
- IPC: H04L12/28 ; H04L43/10

Abstract:
Systems and methods for device-state quality analysis include generating polling schedules based on which accessory devices have yet to be polled, which accessory devices are associated with less than favorable previous polling results, and/or which accessory devices are associated with a priority polling request. Polling requests may be generated using the schedules and the polling requests may be sent to systems associated with the accessory devices. Those systems may return current device-state data, which may be compared to stored device-state data to determine an accuracy value for the stored device-state data. Quality data may be generated using these accuracy values.
Information query