Invention Grant
- Patent Title: Pattern detection in time-series data
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Application No.: US16430808Application Date: 2019-06-04
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Publication No.: US11620528B2Publication Date: 2023-04-04
- Inventor: Sid Ryan , Petar Djukic , Todd Morris , Stephen Shew
- Applicant: Ciena Corporation
- Applicant Address: US MD Hanover
- Assignee: Ciena Corporation
- Current Assignee: Ciena Corporation
- Current Assignee Address: US MD Hanover
- Agency: Clements Bernard Walker
- Agent Christopher L. Bernard
- Main IPC: G06F15/173
- IPC: G06F15/173 ; G06N3/084 ; H04L43/04 ; G06N3/04 ; G06N20/00 ; G06F17/15 ; G06F11/34 ; G06F17/14 ; G06F18/24

Abstract:
Systems and methods for detecting patterns in data from a time-series are provided. In one implementation, a method for pattern detection includes obtaining data in a time-series and creating one-dimensional or multi-dimensional windows from the time-series data. The one-dimensional or multi-dimensional windows are created either independently or jointly with the time-series. The method also includes training a deep neural network with the one-dimensional or multi-dimensional windows utilizing historical and/or simulated data to provide a neural network model. Also, the method includes processing ongoing data with the neural network model to detect one or more patterns of a particular category in the ongoing data, and localizing the one or more patterns in time.
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