- Patent Title: Method for generating an index for quality control, apparatus for generating a quality control index, quality control data generation system, and method for constructing a quality control data generation system
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Application No.: US16367764Application Date: 2019-03-28
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Publication No.: US11619640B2Publication Date: 2023-04-04
- Inventor: Mamoru Ashida , Motonari Daito , Fumiko Kino , Michiko Yoshimoto , Akane Seki , Kazuhiro Nakashima , Hideki Hirano
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Buchanan, Ingersoll & Rooney PC
- Priority: JPJP2018-066070 20180329
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G06F16/22 ; G06F16/215 ; G06F16/23
Abstract:
The method for generating an index for managing the analytical accuracy of a sample analyzer includes a step of acquiring a determination result related to whether a sample is positive or negative from a plurality of sample analyzers, and a step of generating an index based on a ratio of a sample determined to be positive or negative by the plurality of sample analyzers from a plurality of determination results obtained from the plurality of sample analyzers.
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