Invention Grant
- Patent Title: Multi-gate devices and method of fabricating the same
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Application No.: US17718342Application Date: 2022-04-12
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Publication No.: US11600529B2Publication Date: 2023-03-07
- Inventor: Lo-Heng Chang , Chih-Hao Wang , Kuo-Cheng Chiang , Jung-Hung Chang , Pei-Hsun Wang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L29/08 ; H01L29/66 ; H01L21/306 ; H01L21/308 ; H01L29/423 ; H01L27/088 ; H01L21/762 ; H01L29/10 ; H01L29/06

Abstract:
Provided is a semiconductor device including a semiconductor substrate, a plurality of semiconductor nanosheets, a plurality of source/drain (S/D) features and a gate stack. The semiconductor substrate includes a first fin and a second fin. The first fin has a first width less than a second width of the second fin, and a top surface of the first fin is lower than a top surface of the second fin. The plurality of semiconductor nanosheets are disposed on the first fin and the second fin. The plurality of source/drain (S/D) features are located on the first fin and the second fin and abutting the plurality of semiconductor nanosheets. The gate stack wraps each of the plurality of semiconductor nanosheets.
Public/Granted literature
- US20220238385A1 MULTI-GATE DEVICES AND METHOD OF FABRICATING THE SAME Public/Granted day:2022-07-28
Information query
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