Invention Grant
- Patent Title: System and method for data quality monitors
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Application No.: US17222308Application Date: 2021-04-05
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Publication No.: US11599513B2Publication Date: 2023-03-07
- Inventor: Malina Kirn
- Applicant: Palantir Technologies Inc.
- Applicant Address: US CO Denver
- Assignee: Palantir Technologies Inc.
- Current Assignee: Palantir Technologies Inc.
- Current Assignee Address: US CO Denver
- Agency: Knobbe, Martens, Olson & Bear LLP
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/215 ; G06F16/23 ; G06F16/2455 ; G06F11/07 ; A61B17/00 ; A61B17/04 ; G06F3/0482 ; G06F3/04847

Abstract:
Systems and methods are presented for data quality monitoring. Data quality monitors may be created and configured to identify objects with specified data quality issues and/or property values. Objects identified by a data quality monitor can be presented to users for confirmation and resolution. Properties used by the data quality monitor to match objects may also be displayed to users.
Public/Granted literature
- US20210326313A1 SYSTEM AND METHOD FOR DATA QUALITY MONITORS Public/Granted day:2021-10-21
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