Invention Grant
- Patent Title: Charged particle beam apparatus and setting assisting method
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Application No.: US17380124Application Date: 2021-07-20
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Publication No.: US11574795B2Publication Date: 2023-02-07
- Inventor: Kazutaka Watakabe
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2020-124584 20200721
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/22 ; H01J37/244

Abstract:
A UI image includes a reference image, which includes a background image and a schematic image. The background image corresponds to a cross section of a specimen having a multilayer structure. The schematic image includes a figure indicating an electron penetration depth, a figure indicating a characteristic X-ray generation depth, and a figure indicating a back-scattered electron generation depth. These figures are displayed in an overlapping manner or in parallel to each other.
Public/Granted literature
- US20220028654A1 Charged Particle Beam Apparatus and Setting Assisting Method Public/Granted day:2022-01-27
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