Invention Grant
- Patent Title: Charged particle beam device
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Application No.: US17262422Application Date: 2018-08-02
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Publication No.: US11545334B2Publication Date: 2023-01-03
- Inventor: Ryo Komatsuzaki
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2018/029127 WO 20180802
- International Announcement: WO2020/026422 WO 20200206
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/22 ; H01J37/244 ; H01J37/302

Abstract:
The invention provides a charged particle beam device that can accurately move a convergence point of a charged particle beam to a surface of a sample and facilitates a user to grasp a positional relation between the surface of the sample and the convergence point of the charged particle beam. The charged particle beam device according to the invention includes: an electron optics system configured to irradiate a sample table with a charged particle beam; a movable stage on which the sample table is to be placed; a sample chamber that accommodates the movable stage; a detector configured to detect a signal from a sample placed on the sample table; a camera configured to capture an image of the sample table and the sample; an extraction means configured to extract outer shape information relating to outer shapes of the sample table and the sample from the image captured by the camera; a control unit configured to control the movable stage based on the outer shape information; and a display unit configured to display an image relating to the outer shape information together with the image captured by the camera.
Public/Granted literature
- US20210296085A1 Charged Particle Beam Device Public/Granted day:2021-09-23
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