Invention Grant
- Patent Title: Fault finding support system and method
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Application No.: US16686590Application Date: 2019-11-18
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Publication No.: US11544250B2Publication Date: 2023-01-03
- Inventor: Tomoaki Hiruta , Toshiaki Kono , Takayuki Uchida , Yasuharu Namba
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JPJP2018-234378 20181214
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F16/23 ; G06F16/25 ; G07C5/00 ; G01M99/00

Abstract:
A fault finding support system is a fault finding support system for instructing a maintenance worker of an appropriate examination location and examination contents using fault knowledge data in which a causal relationship of fault of a target machine is described, the system including: an examination procedure creation unit that creates an examination procedure with respect to the examination location and the examination contents of the target machine using the fault knowledge data, an examination result storage unit that stores an examination history of performing examination using the examination procedure created by the examination procedure creation unit, an update target extraction unit that recommends an update location of the fault knowledge data using the examination history stored in the examination result storage unit, and a user interface that provides a function of displaying a location extracted by the update target extraction unit and updating the fault knowledge data.
Information query