Invention Grant
- Patent Title: In-process quality assessment for additive manufacturing
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Application No.: US17653024Application Date: 2022-03-01
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Publication No.: US11543388B2Publication Date: 2023-01-03
- Inventor: Neil J Goldfine , Todd M Dunford
- Applicant: JENTEK Sensors, Inc.
- Applicant Address: US MA Marlborough
- Assignee: JENTEK Sensors, Inc.
- Current Assignee: JENTEK Sensors, Inc.
- Current Assignee Address: US MA Marlborough
- Agent Zachary M. Thomas
- Main IPC: G01N27/90
- IPC: G01N27/90 ; B22F3/105 ; B33Y50/02 ; B33Y10/00 ; B33Y30/00 ; G01N27/9013 ; B22F10/20 ; B22F10/30

Abstract:
Disclose is a system and method for real-time measurement and feedback of metrology and metallurgical data during additive manufacturing (AM) part fabrication. This solution promises to provide higher performance, lower cost AM parts. A sensor is placed either in the rake/roller or following the rake/roller so that it has no impact on the process efficiency and can be used to provide real-time feedback and an archived digital map of the entire part volume. The solution provides non-contact sensing of AM layer's electrical conductivity in a high-temperature environment, metallurgical property verification, porosity imaging, local defect detection and sizing, local material temperature monitoring, and grain anisotropy imaging. Part geometry, the AM powder, and the laser/material interface are monitored in real-time. Dual mode sensing using magnetoquasistatic and optical sensors enhance results. Real-time nonlinear control of the AM fabrication process is performed based on the sensor data.
Public/Granted literature
- US20220178877A1 In-Process Quality Assessment for Additive Manufacturing Public/Granted day:2022-06-09
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