Invention Grant
- Patent Title: Determining landmark detectability
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Application No.: US16893575Application Date: 2020-06-05
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Publication No.: US11543259B2Publication Date: 2023-01-03
- Inventor: Akshay Gokhale , Subrata Kumar Kundu
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Main IPC: G01C21/36
- IPC: G01C21/36 ; G01C21/34

Abstract:
In some examples, a system may receive location information. The system may determine at least one landmark based on the location information. In addition, the system may determine one or more current conditions for the at least one landmark. Further, the system may receive sensor configuration information. Based on the sensor configuration information and the one or more current conditions, the system may determine the detectability of the at least one landmark.
Public/Granted literature
- US20210381845A1 DETERMINING LANDMARK DETECTABILITY Public/Granted day:2021-12-09
Information query
IPC分类: