Invention Grant
- Patent Title: Substrate processing apparatus and method of manufacturing semiconductor device
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Application No.: US16047611Application Date: 2018-07-27
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Publication No.: US11542601B2Publication Date: 2023-01-03
- Inventor: Hidenari Yoshida , Takeo Hanashima , Hiroaki Hiramatsu
- Applicant: HITACHI KOKUSAI ELECTRIC INC.
- Applicant Address: JP Tokyo
- Assignee: HITACHI KOKUSAI ELECTRIC INC.
- Current Assignee: HITACHI KOKUSAI ELECTRIC INC.
- Current Assignee Address: JP Tokyo
- Agency: Volpe Koenig
- Main IPC: C23C16/455
- IPC: C23C16/455 ; H01L21/67 ; C23C16/40 ; C23C16/44 ; C23C16/52 ; H01L21/02

Abstract:
Described herein is a technique capable of improving the uniformity of the film formation among the substrates. According to the technique described herein, there is provided a configuration including: a reaction tube having a process chamber where a plurality of substrates are processed; a buffer chamber protruding outward from the reaction tube and configured to supply a process gas to the process chamber, the buffer chamber including: a first nozzle chamber where a first nozzle is provided; and a second nozzle chamber where a second nozzle is provided; an opening portion provided at a lower end of an inner wall of the reaction tube facing the buffer chamber; and a shielding portion provided at a communicating portion of the opening portion between the second nozzle chamber and the process chamber.
Public/Granted literature
- US20180371614A1 SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2018-12-27
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