Invention Grant
- Patent Title: Automatic frequency calibration and lock detection circuit and phase locked loop including te same
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Application No.: US17536514Application Date: 2021-11-29
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Publication No.: US11496137B2Publication Date: 2022-11-08
- Inventor: Baekmin Lim , Seungjin Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2020-0172456 20201210,KR10-2021-0014722 20210202
- Main IPC: H03L7/095
- IPC: H03L7/095 ; H03L7/099 ; H03L7/089 ; H03M7/16

Abstract:
An automatic frequency calibration and lock detection circuit includes a frequency error generator circuit, an automatic frequency calibration signal generator circuit, and a lock flag generator circuit. The frequency error generator circuit generates a frequency error signal based on a reference frequency signal and an output frequency signal. The frequency error signal represents a difference between a frequency of the output frequency signal and a target frequency. The automatic frequency calibration signal generator circuit generates an automatic frequency calibration output signal and an automatic frequency calibration done signal based on the frequency error signal and a first clock signal. The lock flag generator circuit generates a lock done signal based on the frequency error signal, the automatic frequency calibration done signal and a second clock signal. The frequency error generator circuit is shared by the automatic frequency calibration signal generator circuit and the lock flag generator circuit.
Public/Granted literature
- US20220190834A1 AUTOMATIC FREQUENCY CALIBRATION AND LOCK DETECTION CIRCUIT AND PHASE LOCKED LOOP INCLUDING THE SAME Public/Granted day:2022-06-16
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