Invention Grant
- Patent Title: Method of cleaning a substrate
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Application No.: US16780049Application Date: 2020-02-03
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Publication No.: US11495475B2Publication Date: 2022-11-08
- Inventor: Koji Maeda , Hiroshi Shimomoto , Hisajiro Nakano , Masayoshi Imai , Yoichi Shiokawa
- Applicant: EBARA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: EBARA CORPORATION
- Current Assignee: EBARA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2012-220613 20121002
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/67 ; B24B37/34 ; B24B37/04

Abstract:
Various methods of cleaning a substrate are provided. In one aspect, method of cleaning a substrate, comprising: holding and rotating a substrate by a substrate holder; and supplying a chemical liquid to a chemical liquid nozzle and supplying two fluids to a two-fluid nozzle while moving the chemical-liquid nozzle and the two-fluid nozzle radially outwardly from the center to the periphery of the substrate, wherein the distance of the chemical-liquid nozzle from a rotating axis of the substrate holder is longer than the distance of the two-fluid nozzle from the rotating axis of the substrate holder while the chemical-liquid nozzle and the two-fluid nozzle are moved radially outwardly from the rotating axis of the substrate holder.
Public/Granted literature
- US20200176281A1 METHOD OF CLEANING A SUBSTRATE Public/Granted day:2020-06-04
Information query
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