Invention Grant
- Patent Title: X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus
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Application No.: US17365189Application Date: 2021-07-01
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Publication No.: US11490498B2Publication Date: 2022-11-01
- Inventor: Bunta Matsuhana , Goro Kambe
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Priority: JPJP2020-186406 20201109
- Main IPC: H05G1/54
- IPC: H05G1/54 ; H05G1/32 ; H01J35/02 ; H05G1/10

Abstract:
Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.
Public/Granted literature
- US20220151050A1 X-RAY INSPECTION APPARATUS AND DETERIORATION DETERMINATION METHOD FOR X-RAY INSPECTION APPARATUS Public/Granted day:2022-05-12
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