Invention Grant
- Patent Title: Systems and methods for generating image metric
-
Application No.: US16729249Application Date: 2019-12-27
-
Publication No.: US11436720B2Publication Date: 2022-09-06
- Inventor: Zaiwen Gong , Hengze Zhan , Jie-Zhi Cheng , Yiqiang Zhan , Jibing Wu , Xiang Sean Zhou
- Applicant: SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD.
- Current Assignee: SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Metis IP LLC
- Priority: CN201811626384.2 20181228,CN201811632060.X 20181229,CN201811634593.1 20181229
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/11 ; G06N20/00 ; A61B5/00
Abstract:
The present disclosure may provide a method. The method may include processing an image of a subject using a detection model to generate one or more detection results corresponding to one or more objects in the image; and generating an image metric of the image based on the one or more detection results corresponding to the one or more objects.
Public/Granted literature
- US20200211186A1 SYSTEMS AND METHODS FOR GENERATING IMAGE METRIC Public/Granted day:2020-07-02
Information query
